Abstract: Two techniques for deriving refractive index from high- resolution interferometric infrared transmission measurements are presented. The general characteristics of these techniques are described. Artificial data are used to explore the sensitivity of these techniques to various error sources. Refractive index is determined from interferometric measurements of several materials, including diamond, cubic silicon carbide, yttrium oxide, and KRS-5. The described analysis techniques are applied in a complimentary way to develop temperature-dependent Sellmeier type refractive index models that give accurate dispersion and thermo-optic coefficients. For several of these materials our results are the first infrared measurements of temperature-dependent dispersion. Our results are compared to published refractive index and thermo-optic coefficient data when it exists. !12
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