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Aberration Analysis and Calculation in System of Gaussian Beam Illuminates Lenslet Array

机译:高斯光束照亮小透镜阵列系统的像差分析与计算

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摘要

Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI-16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI-16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.
机译:当在与小透镜阵列集成的柯达KAI-16000图像检测器上聚焦高斯光束成像时,便建立了低阶像差。提出了聚焦高斯光束的影响以及像差的数值模拟计算。首先,我们在之前的实验基础上建立了光学成像系统模型。聚焦的高斯光束通过针孔,并被柯达KAI-16000图像检测器接收,该图像检测器的小透镜阵列的微透镜精确地聚焦在传感器表面上。然后,我们说明了聚焦高斯光束的特性以及高斯光束的腰部与微透镜的前球面之间的相对空间位置关系对像差的影响。最后,根据上述两个步骤的结果,分析了低阶像差的主要因素,并计算了小透镜阵列所引起的球差。理论计算表明,数值模拟与实验结果吻合良好。我们的研究结果证明,球差是主要因素,占48 nm误差的93.44%,这在先前的实验中得到了证明。球差与微透镜和腰部之间的发散距离的值成反比,并且与高斯光束腰部半径的值成正比。

著录项

  • 来源
  • 会议地点 San Diego CA(US)
  • 作者单位

    School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;

    School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;

    The College of Optical Sciences, The University of Arizona, Tucson, AZ 85721, U.S.A;

    The College of Optical Sciences, The University of Arizona, Tucson, AZ 85721, U.S.A;

    School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;

    School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Gaussian beam; microlens of lenslet array; spherical aberration; waist radius;

    机译:高斯光束小透镜阵列的微透镜;球差腰radius;

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