School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;
School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;
The College of Optical Sciences, The University of Arizona, Tucson, AZ 85721, U.S.A;
The College of Optical Sciences, The University of Arizona, Tucson, AZ 85721, U.S.A;
School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;
School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China;
Gaussian beam; microlens of lenslet array; spherical aberration; waist radius;
机译:从微透镜阵列的远场强度分布计算平均小透镜形状和像差
机译:高波长光学系统离轴像差的高斯光束模式分析
机译:衍射极限光学系统中经典相差的高斯光束模式分析
机译:计算由高斯-赫姆特光束照射的聚焦器形成的场
机译:定义光线集以分析基于小透镜的光学系统,包括全光摄像机和Shack-Hartmann波前传感器。
机译:用于15 MV光子束的增强型动态楔形和治疗计划系统(TPS)计算的线性阵列测量并与电子门成像设备(EPID)测量进行比较
机译:高斯光束在近轴近似下通过高斯光束照射的轴向光学力的分析计算