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首页> 外文会议>Optics for arts, architecture, and archaeology IV >Laser Induced Plasma Spectroscopy depth profile analysis: a contribution to authentication
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Laser Induced Plasma Spectroscopy depth profile analysis: a contribution to authentication

机译：激光诱导等离子体光谱深度剖面分析：对认证的贡献

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Here the exploitation of the laser induced plasma spectroscopy (LIPS) depth profiling in authentication studies of copper alloy and earthenware artifacts was investigated. Such an approach to the discrimination between original and counterfeit objects is based on the examination of the amplitude and shape of elemental distributions along ablation depths of several hundred microns. Thus, its application pass through preliminary assessments and correction of possible systematic errors of the measured profiles, which was the main aim of the present work. LIPS and ESEM-EDX measurements were carried out on two archaeological findings. We show that deep analytical probing produces not negligible intrinsic broadenings of the measured elemental Sn and Ca peaks and propose a correction based on the convolution integral. According to the latter, we demonstrate the actual depth profile can be calculated from the measured one through the experimental determination of the step response and the application of trial-and-error method.
机译：在此，对铜合金和陶器伪像的鉴定研究中利用激光诱导等离子体光谱（LIPS）深度轮廓分析进行了研究。这种区分原始和伪造物体的方法是基于对沿数百微米烧蚀深度的元素分布的幅度和形状的检查。因此，它的应用是通过初步评估和对测量轮廓的可能系统误差进行校正，这是当前工作的主要目的。 LIPS和ESEM-EDX的测量是根据两个考古发现进行的。我们表明，深层分析探测会产生被测元素Sn和Ca峰的不可忽略的固有展宽，并提出基于卷积积分的校正。根据后者，我们证明了实际的深度剖面可以通过对阶跃响应的实验确定和试错法的应用从所测得的深度剖面中计算得出。

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