首页> 外文会议>Optics for EUV, x-ray, and gamma-ray astronomy VII >On the statistical error of the half energy width
【24h】

On the statistical error of the half energy width

机译:关于半能量宽度的统计误差

获取原文
获取原文并翻译 | 示例

摘要

The half energy width (HEW) is the all powerful performance parameter used to characterize and compare X-ray optics. Values of HEW are always reported without an error bar or confidence interval, suggesting that the statistical error associated with such estimates are negligible. Is this true? And if it is, could one characterize the optics more quickly accepting a non-negligible but still acceptable statistical error in the estimate of the HEW? We try to answer these questions with the use of non-parametric statistical methods and X-ray pencile beam data.
机译:半能量宽度(HEW)是用于表征和比较X射线光学器件的所有强大性能参数。报告的HEW值始终没有误差线或置信区间,这表明与此类估计相关的统计误差可以忽略不计。这是真的?如果是的话,是否可以更快地表征光学器件,以接受HEW估算中不可忽略但仍可接受的统计误差?我们尝试使用非参数统计方法和X射线铅笔束数据来回答这些问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号