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首页> 外文会议>Optoelectronic imaging and multimedia technology IV >Reconstructing spectral reflectance from digital camera through samples selection
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Reconstructing spectral reflectance from digital camera through samples selection

机译：通过样本选择重建数码相机的光谱反射率

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摘要

Spectral reflectance provides the most fundamental information of objects and is recognized as the "fingerprint" of them, since reflectance is independent of illumination and viewing conditions. However, reconstructing high-dimensional spectral reflectance from relatively low-dimensional camera outputs is an ill-posed problem and most of methods requaired camera's spectral responsivity. We propose a method to reconstruct spectral reflectance from digital camera outputs without priori knowledge of camera's spectral responsivity. This method respectively averages reflectances of selected subset from main training samples by prescribing a limit to tolerable color difference between the training samples and the camera outputs. Different tolerable color differences of training samples were investigated with Munsell chips under D65 light source. Experimental results show that the proposed method outperforms classic PI method in terms of multiple evaluation criteria between the actual and the reconstructed reflectances. Besides, the reconstructed spectral reflectances are between 0-1, which make them have actual physical meanings and better than traditional methods.
机译：光谱反射率提供了对象的最基本信息，并且被认为是对象的“指纹”，因为反射率与照明和查看条件无关。但是，从相对低维的相机输出重建高维光谱反射率是一个不适定的问题，大多数方法都恢复了相机的光谱响应度。我们提出了一种从数码相机输出重建光谱反射率的方法，而无需事先了解相机的光谱响应度。该方法通过规定训练样本与相机输出之间可容忍的色差的限制，分别对来自主要训练样本的所选子集的反射率求平均。在D65光源下，使用Munsell芯片研究了训练样品的不同容许色差。实验结果表明，该方法在实际反射率和重建反射率之间的多重评估标准方面优于经典PI方法。此外，重建的光谱反射率在0-1之间，使其具有实际的物理意义，并且优于传统方法。

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  • 来源
    《Optoelectronic imaging and multimedia technology IV》|2016年|100200d.1-100200d.7|共7页
  • 会议地点 Beijing(CN)
  • 作者

    Bin Cao; Ningfang Liao; Wenming Yang; Haobo Chen;

  • 作者单位

    Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China;

    Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China;

    Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China;

    Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education of China, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China,Beijing Institute of Technology, Shenzhen Research Institute, Guangdong 518057, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    reflectance; reconstruction; tolerable color difference; selection; camera outputs;

    机译：反射率重建;容许色差；选择相机输出;

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