An Accurate Thermal Resistance Testing Method for Power Semiconductors

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• 来源
  《PCIM Asia 2015 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management》|2015年|257-263|共7页
• 会议地点 Shanghai(CN)
• 作者

  Jin Zhang; Zhijie Qiu; Xuhui Wen;

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• 作者单位

  Institute of Electrical Engineering, Chinese Academy of Sciences, China,Key Laboratory of Power Electronics and Electric Drive, Chinese Academy of Sciences,China,Beijing Engineering Laboratory of Electrical Drive System Power Electronic DevicePackaging Technology, China,ejzhang@mail.iee.ac.cn;

  Institute of Electrical Engineering, Chinese Academy of Sciences, China,Key Laboratory of Power Electronics and Electric Drive, Chinese Academy of Sciences,China,Beijing Engineering Laboratory of Electrical Drive System Power Electronic DevicePackaging Technology, China;

  Institute of Electrical Engineering, Chinese Academy of Sciences, China,Key Laboratory of Power Electronics and Electric Drive, Chinese Academy of Sciences,China,Beijing Engineering Laboratory of Electrical Drive System Power Electronic DevicePackaging Technology, China;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词