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Analyzing the thermal stability of CsI photocathodes with XPS

机译:用XPS分析CsI光电阴极的热稳定性

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Abstract: The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with x- ray photoelectron spectroscopy (XPS) in this paper. The experimental results indicate that when the vacuum-baking temperature is below 180$DGR@C the chemical states of CsI photocathode are stable, but there is a sublimation of CsI with low rate in high vacuum. When the vacuum-baking temperature is higher than 180$DGR@C, chemical shifts will occur. !9
机译:摘要:本文利用X射线光电子能谱(XPS)研究了真空烘烤对CsI光电阴极化学状态的影响。实验结果表明,当真空烘烤温度低于180 $ DGR @ C时,CsI光电阴极的化学状态稳定,但在高真空下CsI的升华速率较低。当真空烘烤温度高于180 $ DGR @ C时,会发生化学位移。 !9

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