首页> 外文会议>Photonics for Solar Energy Systems >Rigorous validation of the lateral Goos-Hanchen shift in microstructured sun shading systems
【24h】

Rigorous validation of the lateral Goos-Hanchen shift in microstructured sun shading systems

机译:对微结构遮阳系统中Goos-Hanchen横向位移的严格验证

获取原文
获取原文并翻译 | 示例

摘要

In solar control devices based on total internal reflection and microstructured surfaces, the Goos-Hanchen shift can lead to a significant decrease in the geometrical optical solar shading effect. The knowledge of the maximal size of the Goos-Hanchen shift for a specific geometry is an important information to estimate its effect on the desired function of the system. Quantitative measurements of the shift for optical wavelengths seems not feasible and analytical approaches are not suited to identify the maximal shift. By using newly developed numerical techniques, namely the rigorous coupled wave analysis (RCWA), the maximal Goos-Hanchen shift for given parameters can be determined.
机译:在基于全内反射和微结构化表面的太阳能控制设备中,Goos-Hanchen位移会导致几何光学遮阳效果显着降低。了解特定几何形状的Goos-Hanchen位移的最大大小是评估其对系统所需功能的影响的重要信息。对光波长的位移进行定量测量似乎不可行,并且分析方法不适合识别最大位移。通过使用最新开发的数值技术,即严格的耦合波分析(RCWA),可以确定给定参数的最大Goos-Hanchen位移。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号