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Reflection grating photogrammetry

机译:反射光栅摄影测量

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While flat or spherical specular reflecting surfaces can be measured by interferometric methods, the optical three-dimensional measurement of reflecting free formed surfaces is still a demanding task, especially if the contour features geometric discontinuities. For this scope of application, the authors have developed two techniques for the direct three-dimensional measurement of reflecting surfaces, which are based on the evaluation of the mirror image of a grid-like reference structure. One of these techniques employs a pseudo three-dimensional reference structure in combination with one camera for the recording of the virtual image of the reference pattern, while the other, completely new approach utilises a stereo-photogram-metric camera system in conjunction with a merely two-dimensional reference structure. Both systems allow the unambiguous measurement of reflecting free formed surfaces and may be extended by the photogrammetric combination of numerous single measurements, thus even allowing the measurement of rather complex geometries. In this contribution, the calibration procedure for both systems - in particular the determination of the intrinsic and extrinsic parameters of the reference structure - are discussed. Furthermore, the measuring uncertainty of the present setups is analysed, considering measurements of a plane and a spherical reference object.
机译:虽然可以通过干涉法测量平坦或球形的镜面反射表面,但是反射自由形成的表面的光学三维测量仍然是一项艰巨的任务,特别是如果轮廓具有几何不连续性时。对于这种应用范围,作者已经开发了两种直接测量反射表面的技术,它们基于对网格状参考结构的镜像的评估。这些技术之一是将伪三维参考结构与一个摄像机结合使用,用于记录参考图案的虚拟图像,而另一种全新的方法是将立体摄影测量摄像机系统与仅用于摄影机的摄像机结合使用。二维参考结构。两种系统都可以对反射自由形成的表面进行明确的测量,并且可以通过多次单次测量的摄影测量法组合进行扩展,从而甚至可以测量相当复杂的几何形状。在此贡献中,讨论了两个系统的校准程序,特别是确定参考结构的本征和非本征参数的过程。此外,考虑了平面和球形参考物体的测量结果,分析了当前设置的测量不确定度。

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