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Improvements in Laser Beam Characterization with a CCD-Based Setup

机译：基于CCD的设置改善了激光束表征

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CCD-based setups are widely extended in commercial beam profilers. In many beam-profiling applications the high sensitivity of CCD-camera makes necessary the attenuation of the beam. It can affect the beam profile and cause lost of information in regions of low irradiance. In this work we analyze the combined influence of noise and masking in the beam characterization, particularly in the measurement of second order moments. We also apply an extended intensity range imaging technique to improve the quality of the information obtained by a generic instrument. It is achieved merging several images with different sensitivities which are obtained with different integration times.

机译：基于CCD的设置在商用光束轮廓仪中得到了广泛扩展。在许多光束轮廓分析应用中，CCD相机的高灵敏度使得必须衰减光束。它会影响光束轮廓，并导致低辐照度区域的信息丢失。在这项工作中，我们分析了噪声和掩膜在光束表征中的综合影响，特别是在测量二阶矩时。我们还应用了扩展的强度范围成像技术，以提高通过通用仪器获得的信息的质量。通过合并具有不同积分时间获得的具有不同灵敏度的多个图像来实现。

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《Photonics in Measurement》|2004年|225-234|共10页
会议地点 Frankfurt(DE)
作者
R. Gonzalez-Moreno; J. Alonso; J. A. Quiroga; E. Bernabeu;
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正文语种 eng
中图分类光学计量仪器;
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Improvements in Laser Beam Characterization with a CCD-Based Setup

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