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Advanced Phased-Array Strategies for Industrial and Manufacturing Applications

机译：适用于工业和制造应用的高级相控阵策略

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摘要

Examples are presented that illustrate phased-array strategies developed to overcome inspection challenges in industrial and manufacturing applications. In addition to NDT challenges that arise from materials, structure, geometry and defect characteristics, harsh conditions create issues in industrial environments. Manufacturing applications may also demand stringent requirements for speed, automation, ease of use, and extremely robust equipment/methods. The use of multiple probes, large arrays and parallel phased-array systems are ways to achieve high inspection rates, as illustrated for the case of high-speed tube inspection. Automated inspection solutions must also address material handling, and meet challenging mechanical requirements to ensure accurate positioning of test specimens and phased-array probes, as well as extremely accurate part following. The difficulty in meeting these mechanical requirements is increased in those cases where the parts have complicated geometry, or are large and flexible, and where there is substantial part-to-part variation as is often the case with composite parts. A new technique that addresses all of these issues is surface-adaptive ultrasound (SAUL). The SAUL technique measures the inspection surface and adapts the time delays in real time to create shape-corrected scans. Examples are presented that illustrate how SAUL is being used to significantly reduce requirements for accurate probe positioning and part following, while also allowing contoured parts and radii to be inspected with linear probes.
机译：提供的示例说明了为克服工业和制造应用中的检查挑战而开发的相控阵策略。除了材料，结构，几何形状和缺陷特征带来的NDT挑战外，恶劣的条件还会在工业环境中引发问题。制造应用程序可能还对速度，自动化，易用性和极其强大的设备/方法有严格的要求。使用多个探针，大型阵列和并行相控阵系统是实现高检查率的方法，如高速管检查的情况所示。自动化检查解决方案还必须解决材料处理问题，并满足具有挑战性的机械要求，以确保测试样品和相控阵探针的精确定位以及极其精确的零件跟踪。在零件具有复杂的几何形状，或者又大又挠性，并且零件之间存在很大差异的情况下，满足这些机械要求的难度就会增加，复合材料零件经常会遇到这种情况。解决所有这些问题的新技术是表面自适应超声（SAUL）。 SAUL技术可测量检查表面并实时调整时间延迟以创建形状校正的扫描。提供的示例说明了如何使用SAUL来显着降低对精确探针定位和零件跟踪的要求，同时还允许使用线性探针检查轮廓化的零件和半径。

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