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SAXS Measurements and Mapping of Particle Size Distributions of Nanoparticles Formed in Arcs between AgSnO2, Ag and Carbon Electrodes

机译:SAXS测量和在AgSnO2,Ag和碳电极之间的电弧中形成的纳米颗粒的粒度分布图

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This article discusses recent synchrotron radiation based measurements of nanoparticles formation between arcing contacts. In these measurements, the mean size and surface morphology of the particles was determined by fitting a socalled Universal function to the scattering data which consists of scattered X-ray intensity plotted as a function of q = (4pi/lambda)sin theta/2 where theta is the scattering angle and lambda, the x-ray wavelength. By taking the inverse Fourier Transform of this scattering function, it is possible to determine the particle size distribution. We shall present this data, taken as a function of height above the interelectrode axis for the case of Ag, AgSnO2 and C contacts.
机译:本文讨论了最近基于同步辐射的电弧触点之间纳米颗粒形成的测量。在这些测量中,通过将所谓的通用函数拟合到散射数据来确定颗粒的平均大小和表面形态,该散射函数由根据x =(4pi /λ)stheta / 2的函数绘制的散射X射线强度组成,其中θ是散射角和λ,即X射线波长。通过对该散射函数进行傅立叶逆变换,可以确定粒径分布。对于Ag,AgSnO2和C触点,我们将根据在电极间轴上方的高度来表示该数据。

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