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MICROWAVE ENHANCED SILICON KOH ETCHING

机译:微波增强硅酸钾蚀刻

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摘要

A microwave source system have been used to increase silicon etch rate in KOH solution by a factor of about 2, when compared to conventional process. In this work, using a commercial microwave oven (operated at 850W), a home-made microwave system and a polytetrafluoroethylene (PTFE) reactor, where the silicon etching is processed with KOH-water solution, were developed. Silicon wafers, previously oxidized and patterned with standard photo-lithographic process, were etched using 2.5, 5 and 10 M KOH-water solution. The process temperature was manually controlled. The etch solution passes through a heat exchanger for cooling purpose and is pumped back to the reactor. Etch rate of about 1.38 μm/min for the [100] silicon crystal plane and 2.7 nm/min for thermal silicon oxide was achieved.
机译:与传统工艺相比,已经使用微波源系统将KOH溶液中的硅蚀刻速率提高了约2倍。在这项工作中,开发了使用商用微波炉(工作于850W),自制的微波系统和聚四氟乙烯(PTFE)反应器,其中用KOH水溶液对硅进行蚀刻。使用2.5、5和10 M KOH水溶液蚀刻预先用标准光刻工艺氧化和图案化的硅晶片。工艺温度是手动控制的。蚀刻溶液通过用于冷却目的的热交换器,然后泵送回反应器。对于[100]硅晶体平面,蚀刻速率约为1.38μm/ min,对于热氧化硅,蚀刻速率约为2.7nm / min。

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