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首页> 外文会议>Progress in electromagnetics research symposium 2008 (PIERS 2008) >Identification of Defects in Materials with Surface Conductivity Distribution
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Identification of Defects in Materials with Surface Conductivity Distribution

机译：识别具有表面电导率分布的材料中的缺陷

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摘要

The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity σs that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of finite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions.
机译：可以根据在对象边界上捕获的电压测量值来重建表面电导率分布的图像。这种非常著名的技术被称为电阻抗层析成像。图像重建问题是发现这种电导率σs的不适定反问题，该问题使某些优化标准最小化，该优化标准可以由合适的原始目标函数给出。本文介绍了基于随机方法的新算法，可用于获得更准确的重建结果和稳定的解决方案。所提出的方法有望对材料进行无损检测。将显示识别称为蜂窝的特殊结构中的空隙或裂缝的示例。代替实验，我们使用基于有限元方法的幻像评估电压值。将新方法的优点与确定性方法对相同图像重建的特性进行了比较。

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