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首页> 外文会议>Quantum sensing and nanophotonic devices VII >A numerical tool for analyzing light propagation in photonic-crystal waveguides in the presence of fabrication imperfections
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A numerical tool for analyzing light propagation in photonic-crystal waveguides in the presence of fabrication imperfections

机译：在存在制造缺陷的情况下用于分析光子晶体波导中光传播的数值工具

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As they are compatible with on-chip integration, photonic-crystal (PhC) devices operating with slow light represent a promising solution for time-domain processing of optical signals. However, the slow-light transport is strongly impacted by random fabrication fluctuations, such as variations in hole sizes, shapes or locations, and since disorder is regarded as critical in practice, there has been significant effort to determine the induced extrinsic losses. Our current understanding of how does light actually propagate in real photonic-crystal waveguides (PhCWs) relies on perturbation approaches. Although intuitively sound, the latter are only valid in the weak-scattering regime, where the structural imperfections hardly affect the light propagation. Here we introduce a new Bloch mode scattering formalism that overcomes the present limitations of perturbation approaches, since it takes into account the inevitable multiple-scattering that leads to Anderson's localization in such waveguides.
机译：由于它们与片上集成兼容，因此以慢光运行的光子晶体（PhC）器件代表了光信号时域处理的有前途的解决方案。但是，缓慢的光传输会受到随机制造波动（例如孔尺寸，形状或位置的变化）的强烈影响，并且由于在实践中将无序视为关键，因此已进行了大量工作来确定引起的外部损失。我们目前对光在实际的光子晶体波导（PhCW）中实际传播方式的理解依赖于扰动方法。尽管直观上是合理的，但后者仅在弱散射区域有效，在弱散射区域，结构缺陷几乎不会影响光传播。在这里，我们介绍了一种新的Bloch模式散射形式，它克服了摄动方法的当前局限性，因为它考虑到了导致安德森在此类波导中定位的不可避免的多重散射。

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