首页> 外文会议>Sensing for agriculture and food quality and safety V >Hyperspectral Imaging System for Whole Corn Ear Surface Inspection
【24h】

Hyperspectral Imaging System for Whole Corn Ear Surface Inspection

机译:用于整个玉米穗表面检查的高光谱成像系统

获取原文
获取原文并翻译 | 示例

摘要

Aflatoxin is a mycotoxin produced mainly by Aspergillus flavus (A.flavus) and Aspergillus parasitiucus fungi that grow naturally in corn. Very serious health problems such as liver damage and lung cancer can result from exposure to high toxin levels in grain. Consequently, many countries have established strict guidelines for permissible levels in consumables. Conventional chemical-based analytical methods used to screen for aflatoxin such as thin-layer chromatography (TLC) and high performance liquid chromatography (HPLC) are time consuming, expensive, and require the destruction of samples as well as proper training for data interpretation. Thus, it has been a continuing effort within the research community to find a way to rapidly and non-destructively detect and possibly quantify aflatoxin contamination in corn. One of the more recent developments in this area is the use of spectral technology. Specifically, fluorescence hyperspectral imaging offers a potential rapid, and non-invasive method for contamination detection in corn infected with toxigenic A.flavus spores. The current hyperspectral image system is designed for scanning flat surfaces, which is suitable for imaging single or a group of corn kernels. In the case of a whole corn cob, it is preferred to be able to scan the circumference of the corn ear, appropriate for whole ear inspection. This paper discusses the development of a hyperspectral imaging system for whole corn ear imaging. The new instrument is based on a hyperspectral line scanner using a rotational stage to turn the corn ear.
机译:黄曲霉毒素是一种真菌毒素,主要由玉米中天然生长的黄曲霉(A.flavus)和寄生曲霉(Aspergillus parasitiucus)真菌产生。谷物中暴露于高毒素水平会导致非常严重的健康问题,例如肝损害和肺癌。因此,许多国家都为消耗品的允许含量制定了严格的指导原则。用于筛选黄曲霉毒素的常规基于化学的分析方法(例如薄层色谱(TLC)和高效液相色谱(HPLC))既耗时,昂贵,又需要销毁样品并进行适当的数据解释训练。因此,在研究界内一直在努力寻找快速,无损地检测并可能量化玉米中黄曲霉毒素污染的方法。该领域的最新发展之一是频谱技术的使用。具体而言,荧光高光谱成像提供了一种潜在的快速,无创的​​方法,可用于检测被产黄曲霉孢子感染的玉米中的污染物。当前的高光谱图像系统设计用于扫描平坦表面,适用于对单个或一组玉米粒成像。在整个玉米芯的情况下,优选的是能够扫描适合整个耳朵检查的玉米穗的周围。本文讨论了用于整个玉米穗成像的高光谱成像系统的开发。新仪器基于高光谱线扫描仪,该扫描仪使用旋转台旋转玉米穗。

著录项

  • 来源
  • 会议地点 Baltimore MD(US)
  • 作者单位

    Mississippi State University/Geosystems Research Institute Building 1021, Stennis Space Center, MS, USA 39529;

    Mississippi State University/Geosystems Research Institute Building 1021, Stennis Space Center, MS, USA 39529;

    Mississippi State University/Geosystems Research Institute Building 1021, Stennis Space Center, MS, USA 39529;

    SDA-ARS, Southern Regional Research Center 1100 Robert E. Lee Blvd., New Orleans, LA, USA 70179;

    SDA-ARS, Southern Regional Research Center 1100 Robert E. Lee Blvd., New Orleans, LA, USA 70179;

    SDA-ARS, Southern Regional Research Center 1100 Robert E. Lee Blvd., New Orleans, LA, USA 70179;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    aflatoxin; hyperspectral image; rotation; corn ear; surface inspection;

    机译:黄曲霉毒素高光谱图像回转;玉米穗表面检查;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号