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首页> 外文会议>Sensing for Agriculture and Food Quality and Safety VIII >A Sequential Method for Measuring the Optical Properties of Two-layer Media with Spatially-Resolved Diffuse Reflectance: Simulation Study
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A Sequential Method for Measuring the Optical Properties of Two-layer Media with Spatially-Resolved Diffuse Reflectance: Simulation Study

机译：测量空间分辨漫反射的两层介质光学性质的一种顺序方法：仿真研究

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A sequential method for estimating the optical properties of two-layer media with spatially-resolved diffuse reflectance was proposed and validated using Monte Carlo-generated reflectance profiles. The relationship between the penetration depth of detected photons and source-detector separation was first studied. Photons detected at larger source-detector separations generally penetrated deeper into the medium than those detected at small source-detector separations. The effect of each parameter (i.e., the absorption and reduced scattering coefficients (μ_a and μ_s') of each layer, and the thickness of top layer) on reflectance was investigated. It was found that the relationship between the optical properties and thickness of top layer was a critical factor in determining whether photons would have sufficient interactions with the top layer and also penetrate into the bottom layer. The constraints for the proposed sequential estimation method were quantitatively determined by the curve fitting procedure coupled with error contour map analyses. Results showed that the optical properties of top layer could be determined within 10% error using the semi-infinite diffusion model for reflectance profiles with properly selected start and end points, when the thickness of top layer was larger than two times its mean free path (mfp'). And the optical properties of the bottom layer could be estimated within 10% error by the two-layer diffusion model, when the thickness of top layer was less than 16 times its mfp'. The proposed sequential estimation method is promising for improving the estimation of the optical properties of two-layer tissues from the same spatially-resolved reflectance.
机译：提出了一种用于估计具有空间分辨的漫反射率的两层介质的光学特性的顺序方法，并使用蒙特卡洛生成的反射率轮廓进行了验证。首先研究了检测到的光子的穿透深度与源-检测器分离之间的关系。通常，在较大的源-检测器间距处检测到的光子比在较小的源-检测器间距处检测到的光子更深地渗透到介质中。研究了每个参数（即每个层的吸收系数和减小的散射系数（μ_a和μ_s'）以及顶层厚度）对反射率的影响。已经发现，光学性能和顶层厚度之间的关系是确定光子是否与顶层具有足够的相互作用并且还渗透到底层中的关键因素。拟议的顺序估计方法的约束条件是通过曲线拟合程序和误差轮廓图分析定量确定的。结果表明，当顶层的厚度大于其平均自由程的两倍时，使用具有适当选择的起点和终点的反射曲线的半无限扩散模型，可以在10％的误差内确定顶层的光学特性（ mfp”）。当顶层的厚度小于其mfp'的16倍时，通过两层扩散模型可以估算出底层的光学特性，误差在10％以内。所提出的顺序估计方法有望从相同的空间分辨反射率改进对两层组织的光学特性的估计。

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