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THE EFFECT OF INCIDENT LIGHT POLARIZATION ON SPECTRALON BRDF MEASUREMENTS

机译:入射光偏振对光谱BRDF测量的影响

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Many satellite instruments operating in the reflective solar wavelength region between 400nm and 2500nm require accurate and precise determination of the Bidirectional Reflectance Distribution Function (BRDF) of Spectralon diffusers used in their pre-flight and on-orbit calibrations. Calibration measurements of the BRDF of a laboratory optical grade Spectralon diffuse target at different incident polarized light in ultraviolet and visible is presented. The Spectralon diffuser was measured using P and S incident polarized light and over a range of incident and scatter angles from 0 to 60 degrees. The experimental data were obtained using the out-of-plane optical scatterometer located in NASA's Goddard Space Flight Center's Diffuse Calibration Facility's. The typical measurement uncertainty of reported BRDF measurements is 0.7 % (k=1). It is shown how BRDF of Spectralon at P and S polarization of the incident light depends on the incident and scatter angles and on wavelengths. The difference is significant, depends strongly on the incident and scatter angles can be as high as 5.7% at 60 deg incident, 60 deg scatter zenith and 0 deg scatter azimuth angles.
机译:许多在400nm至2500nm的太阳反射波长范围内工作的卫星仪器,需要准确,准确地确定在飞行前和在轨校准中使用的Spectralon漫射器的双向反射分布函数(BRDF)。给出了实验室光学级Spectralon扩散目标的BRDF在紫外和可见光不同入射偏振光下的校准测量结果。使用P和S入射偏振光并在0至60度的入射角和散射角范围内测量Spectralon扩散器。使用位于美国宇航局戈达德太空飞行中心的扩散校准设施中的平面外光散射仪获得了实验数据。报告的BRDF测量的典型测量不确定度为0.7%(k = 1)。示出了在入射光的P和S偏振时Spectralon的BRDF如何取决于入射角和散射角以及波长。差异很大,在很大程度上取决于入射角,在60度入射角,60度散射顶角和0度散射方位角下,散射角可能高达5.7%。

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