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A Study on the Fractal Characteristic of Surface Topograph with a3D Scanning Probe Microscope(SPM)

机译：利用3D扫描探针显微镜（SPM）研究表面形貌的分形特征。

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《Sixth International Conference on Progress of Machining Technology: With Some Topics in Advanced Manufacturing Technology (ICPMT'2002); Sep 10-14, 2002; Xi'an, China》|2002年|754-757|共4页
会议地点 Xian(CN);Xian(CN)
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正文语种 eng
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4. A Study on the Fractal Characteristic of Surface Topograph with a 3D Scanning Probe Microscope(SPM) [C] . International Conference on Progress of Machining Technology (ICPMT'2002) : With Some Topics in Advanced Manufacturing Technology; 20020910-14; Xi'an(CN) . 2002

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8. Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar(+) Ion Bombardment. [R] . Eklund, E. A., Williams, R. S., Snyder, E. J. 1990

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