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Reliability of GaN-Based Vertical Light-Emitting Diodes on Metal Alloy Substrate for Solid State Lighting Application

机译:固态照明应用中金属合金衬底上基于GaN的垂直发光二极管的可靠性

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摘要

In this paper we describe GaN based Vertical Light Emitting diode on Metal Alloy Substrate (VLEDMS) as a disruptive technology to solve the heat dissipation and current-crowding effect for the power device operated at high current. We focus on reliability features of VLEDMS under various operation regimes required for solid state lighting (SSL) application.
机译:在本文中,我们将金属合金衬底(VLEDMS)上的基于GaN的垂直发光二极管描述为一种破坏性技术,以解决大电流工作的功率器件的散热和电流拥挤效应。我们专注于固态照明(SSL)应用所需的各种操作体制下的VLEDMS的可靠性功能。

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