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The Effect of Y on the Strength of FeCrAl Alloy/Sapphire Interfaces

机译:Y对FeCrAl合金/蓝宝石界面强度的影响

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The effect of Y on the interfacial strength of the FeCrAl/sapphire system has been quantitatively measured by the laser-spallation technique in order to understand the 'reactive element effect'. The presence of Y improved the interfacial strength of the FeCrAl/sapphire interface in the as-deposited state from 330 +- 31 MPa to 686 +- 36 MPa. However, after a high temperature anneal of 16 hours at 850℃, the interfacial strength of the Y-free samples increased to 545 +- 68 MPa, while the interfacial strength of Y-containing sample decreased to 599 +- 22 MPa. The increase in the interfacial strength of the Y-free films was attributed to an improvement in the crystalline quality of the interface. The decrease in interfacial strength of the annealed Y-containing film in spite of the improvement in the crystalline quality of the interface was attributed to the depletion of Y at the interface due to formation of Y_2O_3 precipitates, again consistent with the view that Y improves the strength of FeCrAl/sapphire interfaces significantly.
机译:为了理解“反应元素效应”,已经通过激光剥落技术定量测量了Y对FeCrAl /蓝宝石系统界面强度的影响。 Y的存在将沉积状态下的FeCrAl /蓝宝石界面的界面强度从330±31 MPa提高到686±36 MPa。但是,在850℃高温退火16小时后,无Y样品的界面强度增加到545 +-68 MPa,而含Y样品的界面强度降低到599 +-22 MPa。无Y膜的界面强度的增加归因于界面的晶体质量的改善。尽管界面的晶体质量有所改善,但退火后的含Y膜的界面强度下降仍归因于由于形成Y_2O_3沉淀而导致界面处的Y耗尽,这再次与以下观点一致:Y改善了FeCrAl /蓝宝石界面的强度显着提高。

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