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DX center energy level in In_xAl_1-xAs compounds

机译:In_xAl_1-xAs化合物的DX中心能级

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The presence of DX centers in In_xAl_1-xAs, primarily in the indirect protion of the In_xAl_1-xAs bandgap, has been determined using modulation doped In_xAl_1-xAs/In_yGa_1-uAs measurements. From the cooling bias experiment, the PPC, and self consistent Poisson and Schrodinger simulations the ratio of the ionized shallow donors to the DX centers is obtaiend. Using his ratio in the grand canonical ensemble (GCE) the energy level of DX centers is determined. It is found that the DX energy level merges with the conduction band at x approx = 0.42 and is resonant with the conduction band in higher indium concentration.
机译:已经使用调制掺杂的In_xAl_1-xAs / In_yGa_1-uAs测量确定了In_xAl_1-xAs中DX中心的存在,主要是In_xAl_1-xAs带隙的间接影响。从冷却偏差实验,PPC以及自洽Poisson和Schrodinger模拟得出,电离的浅施主与DX中心的比率是固定的。使用他在大规范合奏(GCE)中的比率,可以确定DX中心的能级。发现DX能级在x大约= 0.42处与导带合并,并在较高的铟浓度下与导带共振。

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