首页> 外文会议>Symposium on Epitaxial Oxide Thin Films III March 31-April 2, 1997, San Francisco, California,U.S.A >Effect of lattice strain on growth mechanisms and electrical transport behavior of epitaxial CaRuO_3 thin films
【24h】

Effect of lattice strain on growth mechanisms and electrical transport behavior of epitaxial CaRuO_3 thin films

机译:晶格应变对CaRuO_3外延薄膜生长机理和电传输行为的影响

获取原文
获取原文并翻译 | 示例

摘要

We have observed both metallic and semiconducting behavior in epitaxial thin films of the metallic oxide CaRuO_3 deposited under identical conditions on (100) SrTiO_3 substrates of varying crystalline quality. X-ray diffraction studies showed that while semiconducting films with enlarged unit cells were obtained on single crystal SrTiO_3 substrates, metallic films with lattice parameters close to the bulk material grew on poor crystalline quality SrTiO_3 substrats. The films deposited on (100) LaAlO_3 substrates consistently showed metallic behavior. Atomic force microscope images suggest that the semiconducting films had a coherent two dimensional nucleation. In contrast, three dimensional island-like incoherent growth was seen in the metallic films . It is believed that in the coherent films a strain induced substitution of the small Ru~4+ cations by the larger Ca~2+ cations occurs, breaking the conduction pathway within the three dimensional network of the RuO_6 octahedra and leading to a metal-insulator transition. This unique phenomenon-which is not observed in bulk mateiral-can be significant in technologiclly important epitaxial perovskite oxide heterostructures.
机译:我们已经观察到金属氧化物CaRuO_3的外延薄膜在相同条件下沉积在(100)具有不同晶体质量的SrTiO_3衬底上的金属行为和半导体行为。 X射线衍射研究表明,虽然在单晶SrTiO_3衬底上获得了具有增大的晶胞的半导体膜,但晶格参数接近于块状材料的金属膜却在较差的晶体质量SrTiO_3基质上生长。沉积在(100)LaAlO_3衬底上的薄膜始终显示出金属行为。原子力显微镜图像表明,半导体薄膜具有连贯的二维成核作用。相反,在金属膜中观察到三维岛状非相干生长。可以认为,在相干膜中,应变诱导了较小的Ru〜4 +阳离子被较大的Ca〜2 +阳离子取代,从而破坏了RuO_6八面体的三维网络内的传导路径,并导致了金属绝缘体过渡。这种独特的现象-在本体材料中没有观察到-在技术上重要的外延钙钛矿氧化物异质结构中可能很重要。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号