首页> 外文会议>Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held April 4-9, 1999, San Francisco, California, U.S.A. >NOvel device concept for voltage-bias controlled color detection in amorphous silicon sensitized COMS cameras
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NOvel device concept for voltage-bias controlled color detection in amorphous silicon sensitized COMS cameras

机译:用于非晶体硅敏化COMS摄像机中电压偏置控制的颜色检测的NOvel设备概念

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摘要

We present a novel sensor concept comprising a new contacting scheme for voltage-bias controlled thin film photodiode arrays on CMOS readout chips. Our unilateral contact structure greatly facilitates manufacturing of the sensor system. Moreover, the novel contacting scheme most efficiently suppresses crosstalk between neighoring pixels. The respective devices are ready for operation and testing directly affter deposition of the amorphous silcion based sensor layers. No extra the thin film stack and the underlying readout chip. Due to the lack of a metal oxide front contact, contamination of CMOS manufacturing equipkent with tin, zinc or similar materials is definitely avoided. Thuse, for the first time, a sensor concept with complete CMOS process compatibility is demonstrated. Our new sensor structure allows for a considerable reduction in manufacturing cost of high performance optical detection systems. As a proof of concept, we present detailed investigations on current-voltage characteristics, dynamic behavior and spectral respoonse of 0.1-inch test structures. Donwn-scaling to pixel sizes in the micron rages is evaluated by semi-empirical numerical modeling and proves easily feasible.
机译:我们提出了一种新颖的传感器概念,其中包括针对CMOS读出芯片上的电压偏置控制的薄膜光电二极管阵列的新接触方案。我们的单边接触结构极大地方便了传感器系统的制造。此外,新颖的接触方案最有效地抑制了相邻像素之间的串扰。各个设备已准备就绪,可以进行操作并直接测试基于非晶硅的传感器层的沉积。无需额外的薄膜堆栈和底层的读取芯片。由于缺少金属氧化物前触点,因此绝对避免了用锡,锌或类似材料污染CMOS制造设备。因此,首次展示了具有完全CMOS工艺兼容性的传感器概念。我们的新传感器结构可大幅降低高性能光学检测系统的制造成本。作为概念验证,我们对0.1英寸测试结构的电流-电压特性,动态行为和频谱响应进行了详细研究。通过半经验数值模型评估将Donwn缩放为微米级别的像素大小,并证明很容易实现。

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