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首页> 外文会议>Symposium on Flat-Panel Displays and Sensors-Principles, Materials and Processes held April 4-9, 1999, San Francisco, California, U.S.A. >Field emission energy distribution and current-voltage characteristics using single tip gated diodes
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Field emission energy distribution and current-voltage characteristics using single tip gated diodes

机译：使用单尖端门控二极管的场发射能量分布和电流-电压特性

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摘要

Field emission current-voltage characteristics and simultaneous field emission electron energy distributions have been measured using single tip gate diodes. An energy distribution is generated at each step of a current-voltage characteristic using a compact low-cost simulated hemispherical energy analyzer. A PC programmed with graphics-based data acquisition software is used for data acquisition and control. The PC is connected to a CAMAC crate and a picoammeter through a GPIB interface. The picoammeter measures the current leaving the tip and the field emission electrons are energy analyzed, detected and processed in the CAMAC crate. The CAMAC crate also sends control voltages to the gate anode and the energy analyzer. This apparatus was used to measure tip work functions and Fowler-Nordheim tip shape parameters for Mo and IrO_2 field emission tips. Work function measurements from field emission tips are compared to photoelectric work function measurements from flat surfaces.
机译：场发射电流-电压特性和同时场发射电子能量分布已使用单尖端栅极二极管进行了测量。使用紧凑型低成本模拟半球形能量分析仪，可在电流-电压特性的每个步骤生成能量分布。使用基于图形的数据采集软件编程的PC进行数据采集和控制。 PC通过GPIB接口连接到CAMAC板条箱和皮安表。皮安表测量离开尖端的电流，并在CAMAC板条箱中对场发射电子进行能量分析，检测和处理。 CAMAC板条箱还将控制电压发送到栅极阳极和能量分析仪。该设备用于测量Mo和IrO_2场发射尖端的尖端功函数和Fowler-Nordheim尖端形状参数。将来自场发射尖端的功函数测量结果与来自平坦表面的光电功函数测量结果进行比较。

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