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Why is KPZ type surface roughening so hard to observe?

机译:为什么KPZ型表面粗糙如此难以观察?

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摘要

The Kardar-Parisi-Zhang (KPZ) surface roughening model was proposed nearly fifteen years ago. Although there have been many theoretical studies, there are very few experimental examples of thin film evolution obeying the KPZ equation. We discuss the physical basis of the KPZ equation and suggest possible reasons for the departure from KPZ behavior that is usually observed in surface growth/etching processes. Particularly, we construct a non-local, KPZ-like growth model that takes into account the effect of surface re-emission and show that, for certain limits, our model reduces to the KPZ model. We also discuss various experimental results in the context of known roughening models, including our model.
机译:Kardar-Parisi-Zhang(KPZ)表面粗糙化模型是在15年前提出的。尽管有许多理论研究,但很少有遵循KPZ方程的薄膜演化实验实例。我们讨论了KPZ方程的物理基础,并提出了偏离KPZ行为的可能原因,这种现象通常在表面生长/蚀刻过程中观察到。特别是,我们构建了一个非本地的,类似于KPZ的增长模型,该模型考虑了表面再发射的影响,并表明在某些限制下,我们的模型简化为KPZ模型。我们还将在已知的粗糙化模型(包括我们的模型)的背景下讨论各种实验结果。

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