首页> 外文会议>Symposium on Materials and Devices for Optoelectronics and Microphotonics, Apr 1-5, 2002, San Francisco, California >A Chemical Perspective of GaN Polarity: The use of Hydrogen Plasma Dry Etching Versus NaOH Wet Etching to Determine Polarity
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A Chemical Perspective of GaN Polarity: The use of Hydrogen Plasma Dry Etching Versus NaOH Wet Etching to Determine Polarity

机译:GaN极性的化学观点:使用氢等离子体干蚀刻与NaOH湿蚀刻来确定极性

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摘要

The use of dry hydrogen plasma etching is evaluated for determination of GaN polarity and critically compared to wet etching in NaOH. It is shown that hydrogen plasma etching is effective in revealing inversion domains (IDs) and some types of dislocations. This is because the surface morphology is unchanged by the hydrogen treatment, and, hence, the surface reactivity is not masked.
机译:评估了使用干法氢等离子体刻蚀确定GaN极性的方法,并将其与NaOH中的湿法刻蚀进行了严格比较。结果表明,氢等离子体刻蚀可以有效地揭示反型畴(IDs)和某些类型的位错。这是因为通过氢处理,表面形态没有变化,因此表面反应性未被掩盖。

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