首页> 外文会议>Symposium on Microcrystalline and Nanocrystalline Semiconductors-1998 held November 30-December 3, 1998, Boston, Massachusetts, U.S.A. >Long luminescence lifetime of 1.54 #mu# m Er~(3+) luminescence from erbium doped silicon rich silicon oxide and its origin
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Long luminescence lifetime of 1.54 #mu# m Er~(3+) luminescence from erbium doped silicon rich silicon oxide and its origin

机译:掺富硅氧化硅的长发光寿命为1.54#mu#m Er〜(3+)

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摘要

The photoluminescent properties of erbium doped silicon rich silicon oxide (SRSO) is investigated. The silicon content of SRSO was varied from 43 to 33 at.percent, and Er concentration was 0.4-0.7 at.percent in all cases. We observe strong 1.54 #mu# m luminescence due to ~4I_(13/2)=>~4I_(15/2) Er~(3+) 4f transition, excited via energy transfer from carrier recombination in silicon nanoclusters to Er 4f shells. The luminescent lifetimes at the room temperature are found to be 4-7 msec, which is longer than that reported from Er in any semiconducting host material, and comparable to that of Er doped SiO_2 and Al_2O_3. The dependence of the Er~(3+) luminescent intensities and lifetimes on temperature, pump power and on background illumination shows that by using SRSO, almost all non-radiative decay paths of excited Er~(3+) can be effectively suppressed, and that such suppression is more important than increasing excitation rate of Er~(3+). A planar waveguide using Er doped SRSO is also demonstrated.
机译:研究了掺do的富硅氧化硅(SRSO)的光致发光性能。在所有情况下,SRSO的硅含量从43到33 at。%不等,Er浓度为0.4-0.7 at。%。我们观察到由于〜4I_(13/2)=>〜4I_(15/2)Er〜(3+)4f跃迁而产生的强1.54#μmm发光,这是通过将能量从硅纳米团簇中的载流子重组转移到Er 4f壳层而激发的。发现在室温下的发光寿命为4-7毫秒,这比在任何半导体主体材料中从Er报道的发光寿命更长,并且与Er掺杂的SiO_2和Al_2O_3的发光寿命相当。 Er〜(3+)发光强度和寿命与温度,泵浦功率和背景照明的关系表明,通过使用SRSO,几乎可以抑制激发的Er〜(3+)的几乎所有非辐射衰减路径,并且说明这种抑制比增加Er〜(3+)的激发速率更重要。还展示了使用掺Er的SRSO的平面波导。

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