Atomic Force Microscopy Contact Mode Study on Ultra High Molecular Weight Polyethylene

机译：超高分子量聚乙烯的原子力显微镜接触模式研究

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This paper presents the results of contact mode atomic force microscopy (AFM) study on the nanoscale Young's modulus and work of adhesion of ultra high molecular weight polyethylene (UHMWPE). Cryoultramicrotomed surfaces of UHMWPE were scanned using the contact mode of AFM. Fibril regions are commonly found on the sample, however, a non-fibril paniculate region was also found. AFM force displacement curves were obtained for the sample. The JKR theory and Maugis Dugdale model were used for the analysis. A good fitting between the theories and experimental data was found. The nanoscale Young's modulus and work of adhesion of UHMWPE extracted from the experimental data were in reasonably good agreement with the values reported in other literatures.

机译：本文介绍了接触模式原子力显微镜（AFM）对纳米级杨氏模量和超高分子量聚乙烯（UHMWPE）的粘附作用的研究结果。使用AFM的接触模式扫描超高分子量聚乙烯的超薄切片表面。通常在样品上发现原纤维区域，但是，还发现了非原纤维颗粒区域。获得了样品的AFM力位移曲线。使用JKR理论和Maugis Dugdale模型进行分析。在理论和实验数据之间找到了很好的拟合。从实验数据中提取的纳米级杨氏模量和UHMWPE的粘附功与其他文献报道的值相当吻合。

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《Symposium Proceedings vol.874; Symposium on Structure and Mechanical Behavior of Biological Materials; 20050329-31; San Francisco,CA(US)》|2005年|P.173-178|共6页
会议地点 San FranciscoCA(US)
作者
Yifang Cao; Jikou Zhou; Oludele Popoola; Dal F. Swarts; Wole Soboyejo;
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Princeton Institute of Materials Science and Engineering (PRISM) Princeton University Princeton, NJ 08544;

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正文语种 eng
中图分类材料;
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Atomic Force Microscopy Contact Mode Study on Ultra High Molecular Weight Polyethylene

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