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首页> 外文会议>Symposium on Thermoelectric Materials 1998-The Next Generation Materials for Small-Scale Refigeration and Power Generation Applications held November 30-December 3, 1998, Boston, Massachusetts, U.S.A. >Thermoelectirc and structural properties of Bi_(1-x)Te_(1+x_ thin films on CdTe(111)
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Thermoelectirc and structural properties of Bi_(1-x)Te_(1+x_ thin films on CdTe(111)

机译：CdTe（111）上Bi_（1-x）Te_（1 + x_）薄膜的热电性能和结构性能

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摘要

Thin flms of the hexagonal phase of Bi_(1-x)Te_(1+x) have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns ( theta -2 theta scans and rocking curves) of the films hsows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi_(1-x)Te_(1+x) is an appropriate model system to study the dependencies of thermoelectric and s tructural poperties on binary composition.
机译：Bi_（1-x）Te_（1 + x）六方相的薄薄膜已使用分子束外延（MBE）在CdTe（111）衬底上生长。薄膜的X射线衍射图（θ-2θ扫描和摇摆曲线）分析表明，其结晶度取决于与化学计量BiTe的组成偏差。对膜的温度相关热电功率（TEP）的测量表明，成分变化会导致TEP从电子主导（n型）到空穴主导（p型）变化，这意味着它们可能用作热电冷却器或电源发电机。进行了膜的随温度变化的电阻率的测量，该分析显示出半金属行为。这些结果表明，Bi_（1-x）Te_（1 + x）是研究热电和结构特征对二元组成的依赖性的合适模型系统。

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