In-situ reflectivity measurements during pulsed-laser deposition of Bi_2Sr_2CaCu_2O_(8+delta)

机译：Bi_2Sr_2CaCu_2O_（8 + delta）脉冲激光沉积过程中的原位反射率测量

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Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi_2Sr_2CaCu_2O_(8+delta) films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few lattice constants reflectivity is shown to be sensitive to changes in deposition temperature near the decomposition limit.

机译：反射率测量已用于通过脉冲激光沉积（PLD）监测Bi_2Sr_2CaCu_2O_（8 +δ）在（100）MgO上原位生长期间表面形貌的时间演变。可以区分具有不同表面粗糙度的两种状态。在前几个晶格常数的沉积过程中，反射率显示出对分解极限附近的沉积温度变化敏感。

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《Symposium F: Third International Conference on Laser Ablation (Cola'95) of the 1995 E-Mrs Spring Conference May 22-26, 1995 Strasbourg, France》|1995年|p.721-725|共5页
会议地点 Strasbourg(FR);Strasbourg(FR)
作者
Alfons Ritzer; B.Falkner; S.T.Li; D.Baeuerle;
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原文格式 PDF
正文语种 eng
中图分类一般工业技术;
关键词
Bi_2Sr_2CaCu_2O_(8+delta); pulsed-laser depostion; thin films; high temperature superconductivity; reflectivity;

机译：Bi_2Sr_2CaCu_2O_（8 + delta）;脉冲激光变位薄膜；高温超导；反射率;

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2. Reflectivity and energy balance in pulsed-laser deposition experiments from mono- and bi-atomic targets - art. no. 026403 [J] . Muller T., Sinha BK., Rohr KP. Physical review, E. Statistical physics, plasmas, fluids, and related interdisciplinary topics . 2002,第2aPta2期

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4. In-situ reflectivity measurements during pulsed-laser deposition of Bi_2Sr_2CaCu_2O_(8+delta) [C] . Alfons Ritzer, B.Falkner, S.T.Li, Symposium F: international conference on laser ablation . 1996

机译：在Bi_2SR_2CACU_2O_（8 + DELTA）的脉冲激光沉积期间的原位反射率测量
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In-situ reflectivity measurements during pulsed-laser deposition of Bi_2Sr_2CaCu_2O_(8+delta)

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