Probing paper surfaces with tof sims-a new tool for problem solving

机译：使用tof sims探测纸张表面-解决问题的新工具

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Time of Flight (ToF) secondary ion mass spectroscopy (SIMS) is a relatively new tecnique for probing the chemistry of surfaces. We have applied SIMS to a wide variety of papers and papermaking problems and found it to be a powerful tool for analysis and problem solving. A number of applications are discussed in detail with emphasis on problems involving defects and runnability. SIMS helped resolve a sizing problem in which we found pitch to be a highly effective desizing agent. This brings a new insight to an old problem - why some pulps are more difficult to size than others.

机译：飞行时间（ToF）二次离子质谱（SIMS）是一种用于探测表面化学的相对较新的技术。我们已将SIMS应用于各种纸张和造纸问题，并发现SIMS是分析和解决问题的强大工具。详细讨论了许多应用程序，重点放在涉及缺陷和可运行性的问题上。 SIMS帮助解决了上浆问题，我们发现沥青是一种高效的退浆剂。这为一个旧问题带来了新的见解-为什么某些纸浆比其他纸浆更难分选。

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《TAPPI 1996 Papermakers Conference Philadelphia, PA March 24-27》|1996年|p.325-334|共10页
会议地点 Philadelphia PA(US)
作者
R.J.Kulick; J.S.Brinen;
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正文语种 eng
中图分类轻工业、手工业;
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Probing paper surfaces with tof sims-a new tool for problem solving

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