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Detection of small metal particles by a quasi-optical system at sub-millimeter wavelength

机译:准光学系统在亚毫米波长下检测小金属颗粒

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Inspection of alien metal particles in electronic materials such as glass fibers and resins is a critical issue to control the quality and guarantee the safety of products. In this paper, we present a new detection technique using sub-millimeter wave for films as electric materials in product lines. The advantage of using sub-millimeter wave frequency is that it is easy to distinguish conductive particles from a nonconductive material such as plastic films. Scattering of a sub-millimeter wave by a metal particle is used as the detection principle. By simulation, it is observed that the scattering pattern varies intricately as the diameter varies from 10 to 700 μm at 300 GHz. The demonstration system is composed of a Keysight performance network analyzer (N5247A PNA-X) with 150-330 GHz VDI extension modules, transmitting and receiving antennas, and focusing dielectric lens. An output signal is radiated via an antenna and focused onto a metal particle on a film. The wave scattered by the metal particle is detected by an identical antenna through a lens. The signal scattered from a metal particle is evaluated from the insertion loss between antennas (S_(21)). The result shows that a particle of diameter 300 μm is detectable at 150-330 GHz through S_(21) in the experimental system that we prepared. Peaks calculated in simulation were detected in experimental data as well as in the curves of the particle diameter versus S_(21). It was shown that using this peak frequency could improve S_(21) level without higher frequency.
机译:检查电子材料(例如玻璃纤维和树脂)中的外来金属颗粒是控制质量和确保产品安全的关键问题。在本文中,我们提出了一种使用亚毫米波检测薄膜作为生产线中电子材料的新技术。使用亚毫米波频率的优点是易于区分导电颗粒与非导电材料(例如塑料薄膜)。金属粒子对亚毫米波的散射被用作检测原理。通过仿真,观察到散射图案随着直径在300 GHz下从10到700μm的变化而复杂地变化。该演示系统由具有150-330 GHz VDI扩展模块的Keysight性能网络分析仪(N5247A PNA-X),发射和接收天线以及聚焦介电透镜组成。输出信号通过天线辐射并聚焦到薄膜上的金属颗粒上。由金属粒子散射的波由同一天线通过透镜检测。从天线之间的插入损耗评估从金属颗粒散射的信号(S_(21))。结果表明,在我们制备的实验系统中,可以通过S_(21)在150-330 GHz处检测到直径为300μm的粒子。在实验数据以及粒径与S_(21)的关系曲线中检测到模拟计算出的峰。结果表明,使用该峰值频率可以在不提高频率的情况下提高S_(21)水平。

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