Microfabrication and cold testing of copper circuits for a 50 Watt, 220 GHz traveling wave tube

著录项

• 来源
  《Terahertz, RF, millimeter, and submillimeter-wave technology and applications VI》|2013年|862406.1-862406.9|共9页
• 会议地点 San Francisco CA(US)
• 作者

  Colin D. Joye; Alan M. Cook; Jeffrey P. Calame; David K. Abe; Alexander N. Vlasov; Igor A.Chernyavskiy; Khanh T. Nguyen; Edward L. Wright;

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• 作者单位

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  U. S. Naval Research Laboratory, 4555 Overlook Ave, SW, Washington, DC, USA 20375;

  Beam-Wave Research, Inc., Bethesda, MD, USA 20814;

  Beam-Wave Research, Inc., Bethesda, MD, USA 20814;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Slow-wave circuit; traveling wave tube; millimeter wave amplifiers; ultraviolet photolithography;

  机译：慢波电路；行波管毫米波放大器；紫外线光刻;