首页> 外文会议>third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotel in Baltimore, Maryland, from May 9 to 12, 1998. >Apollo 11 lunar samples: an examination using tapping mode atomic force microscopy and other microscopic methods
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Apollo 11 lunar samples: an examination using tapping mode atomic force microscopy and other microscopic methods

机译:阿波罗11号月球样品:使用拍击模式原子力显微镜和其他显微镜方法的检查

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摘要

We used atomic force microscopy (AFM) int he tapping mode, scanning electron microscopy (SEM), energy dispersive x-ray analysis (EDS) and light microscopy (LM) to study the morphological features of a rock sample collected during the Apollo 11 mission to the moon. Wavelike patterns in the rocks measuring approximately 460 A across are indicative of rapid cooling, which probably took place foolwing some catastrophic event during the formation of the moon. Microscopic information can be used to establish a database so that comparisons between surface morphologies of these and other rocks can be made.
机译:我们使用原子力显微镜(AFM)进行攻丝模式,扫描电子显微镜(SEM),能量色散X射线分析(EDS)和光学显微镜(LM)研究了在阿波罗11号任务期间收集的岩石样品的形态特征到月球。大约460 A宽的岩石中的波浪状图案表明快速冷却,这很可能是在月球形成过程中愚弄了一些灾难性事件而发生的。微观信息可用于建立数据库,以便在这些岩石和其他岩石的表面形态之间进行比较。

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