首页> 外文会议>Third European conference on radiation and its effects on components and systems >An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)
【24h】

An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

机译:Actel现场可编程门阵列(FPGA)中重离子诱导介电破裂的实验研究

获取原文
获取原文并翻译 | 示例

摘要

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.
机译:进行了辐射和后续的故障分析,以研究Actel FPGA中的单事件电介质破裂(SEDR)与离子LET(线性能量转移),角度,偏置,温度,特征尺寸和器件类型的关系。较小的横截面意味着大多数航天器使用的风险较低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号