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Highly reliable 0.98#mu#m laser diodes with a window structure fabricated by Si-ion implantation

机译:通过硅离子注入制成的具有窗口结构的高度可靠的0.98#μ#m激光二极管

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摘要

We report on highly reliable 0.98 #mu#m laser diodes (LDs) with a window structure using Si ion implantation followed by thermal annealing. Such Lds have operated very stable over 10,000 hours and they have achieved a mean time to failure of 220,000 hours. No catastrophic optical damage has been observed up to thermally limited maxiumum output power even after operation for 1,000 hours under the condition of 50 deg C at 150 or 200mW.
机译:我们报道了一种高度可靠的0.98#mu#m激光二极管(LD),其具有采用Si离子注入然后进行热退火的窗口结构。这样的Lds在10,000个小时内已经非常稳定地运行,并且平均故障时间达到220,000个小时。即使在50摄氏度,150或200mW的条件下运行1,000小时后,在达到热限制的最大输出功率时也未观察到灾难性的光学损坏。

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