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Performance of an analog ASIC developed for the frond-end electronics of the Soft X-ray Imager onboard ASTRO-H

机译:为ASTRO-H板载X射线成像仪的前端电子设备开发的模拟ASIC的性能

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摘要

We report on the performance of an analog application-specified integrated circuit (ASIC) developed for the front-end electronics of the X-ray CCD camera system (SXI: Soft X-ray Imager) onboard the ASTRO-H satellite. The ASIC consists of four identical channels and they simultaneously process the CCD signals at the pixel rate of 68 kHz. ΔΣ modulator is adopted to achieve effective noise shaping and obtain a high resolution decimal values with relatively simple circuits. We will implement 16 ASIC chips in total in the focal plane assembly. The results of the unit test shows that it works properly with moderately low input noise of ≤30μV at the pixel rate of 80 kHz. Power consumption is sufficiently low of ~150mW. Dynamic range of input signals is ±20 mV that covers effective energy range of the CCD chips of SXI (0.2 - 20keV). The integrated non-linearity of 0.2 % satisfies the same performance as the conventional CCD detectors in orbit. The radiation tolerance against total ionizing dose (TID) effect and single event latch-up (SEL) has also been investigated. The irradiation test using ~(60)Co gamma-rays and proton beam showed that the ASIC has sufficient tolerance against TID up to 200 and 167 krad respectively, which thoroughly exceeds the expected operating duration in the planned low-inclination low-earth orbit. The irradiation of the Fe ion beam also showed no latch-up nor malfunctions up to the fluence of 4.7×10~7 ions. The threshold against SEL is larger than 1.68 MeVcm~2/mg, which is sufficiently high enough that SEL events should not be a major cause of instrument downtime.
机译:我们报告了为ASTRO-H卫星上的X射线CCD摄像机系统(SXI:软X射线成像仪)的前端电子设备开发的模拟专用集成电路(ASIC)的性能。 ASIC由四个相同的通道组成,它们同时以68 kHz的像素速率处理CCD信号。采用ΔΣ调制器可实现有效的噪声整形,并通过相对简单的电路获得高分辨率的十进制值。我们将在焦平面组件中总共实施16个ASIC芯片。单元测试的结果表明,在像素速率为80 kHz的情况下,当输入噪声≤30μV时,它可以正常工作。功耗足够低至〜150mW。输入信号的动态范围为±20 mV,涵盖SXI CCD芯片的有效能量范围(0.2-20keV)。 0.2%的积分非线性可以满足与常规CCD探测器在轨相同的性能。还研究了针对总电离剂量(TID)效应和单事件闩锁(SEL)的辐射耐受性。使用〜(60)Coγ射线和质子束进行的辐射测试表明,ASIC分别具有高达200 kD和167 krad的TID足够的耐受性,这完全超出了计划的低倾角低地球轨道的预期工作时间。 Fe离子束的辐照在4.7×10〜7离子通量范围内也没有闭锁或故障。 SEL的阈值大于1.68 MeVcm〜2 / mg,该阈值足够高,SEL事件不应成为仪器停机的主要原因。

著录项

  • 来源
  • 会议地点 San Diego CA(US)
  • 作者单位

    Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan;

    rnDepartment of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan;

    rnDepartment of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan;

    rnDepartment of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan;

    rnDepartment of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan;

    rnNoqsi Aerospace Ltd., 2822 South Nova Road, Pine, Colorado 80470, USA;

    rnInstitute of Space and Astronauti;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 航空仪表、航空设备;X射线、紫外线、红外线;
  • 关键词

    ASIC; X-rays; CCD; ASTRO-H;

    机译:ASIC; X射线CCD;天文-H;

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