Effect of Thermal strain in helical slow-wave circuit on TWT Cold-test characteristics

机译：螺旋慢波电路中的热应变对TWT冷测试特性的影响

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The heat transfer analysis presented in this study deals with the thermal performance of the helix slow-wave circuit for TWT. The current paper estimate the temperature of helix accurately through finite element software ANSYS. The expansion of rods makes

机译：本研究中介绍的传热分析处理了TWT螺旋慢波电路的热性能。本文通过有限元软件ANSYS精确估算了螺旋线的温度。杆的膨胀使

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来源
《Vacuum Electronics Conference, 2007 IEEE International》|2007年|P.1-2|共2页
会议地点 KitakyushuJapan
作者
Lieming Yao; Zhonghai Yang; Zhongsheng Huo; Xiaofang Zhu; Bin Li;
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finite element analysis; heat transfer; slow wave structures; TWT cold-test characteristics; finite element software ANSYS; heat transfer analysis; helical slow-wave circuit; phase velocity; thermal strain effect;

机译：有限元分析;传播热量;慢波结构； TWT冷测试特性；有限元软件ANSYS；传热分析；螺旋慢波电路相速度热应变效应;

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专利

1. Effect of Thermal Strain in Helical Slow-Wave Circuit on TWT Cold-Test Characteristics [J] . Yan S., Yao L., Yang Z. IEEE Transactions on Electron Devices . 2008,第8期

机译：螺旋慢波电路中的热应变对TWT冷测试特性的影响
2. Effect of helical slow-wave circuit variations on TWT cold-test characteristics [J] . Kory C.L., Dayton J.A. Jr. IEEE Transactions on Electron Devices . 1998,第4期

机译：螺旋慢波电路变化对TWT冷测试特性的影响
3. Accurate cold-test model of helical TWT slow-wave circuits [J] . Kory C.L., Dayton J.A. Jr. IEEE Transactions on Electron Devices . 1998,第4期

机译：螺旋TWT慢波电路的精确冷测试模型
4. Effect of Thermal strain in helical slow-wave circuit on TWT Cold-test characteristics [C] . Lieming Yao, Zhonghai Yang, Zhongsheng Huo, IEEE International Vacuum Electronics Conference . 2007

机译：热应变在螺旋慢波电路上对TWT冷验特性的影响
5. Mitigation of Thermally Induced Soft Errors in CMOS Nanoscale Circuits [D] . Islam, Md. Sofikul. 2017

机译：CMOS纳米级电路中热诱导的软误差减轻
6. Cell-Type-Specific Dynamics of Calcium Activity in Cortical Circuits over the Course of Slow-Wave Sleep and Rapid Eye Movement Sleep [O] . Niels Niethard, Svenja Brodt, Jan Born 2021

机译：慢波睡眠速度快速睡眠过程中皮质电路中钙活性的细胞型特异性动态
7. Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits [O] . Kory, Carol L., Dayton, James A., Jr. 1997

机译：螺旋TWT慢波电路的精确冷测试模型
8. Effect of Helical Slow-Wave Circuit Variations on TWT Cold-Test Characteristics [R] . Kory, C. L. , Dayton, J. A. 1998

机译：螺旋慢波电路变化对TWT冷态特性的影响

Effect of Thermal strain in helical slow-wave circuit on TWT Cold-test characteristics

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