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Scandium and gallium implantation doping of silicon carbide

机译:碳化硅的and镓注入掺杂

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Rutherford backscattering, Raman spectroscopy as well as photoluminescence, resistivity and Hall measurements have been used to investigate the doping behaviour of Scandium and Gallium ions implanted into Silicon Carbide respectively. The recovery of the crystal lattice after implantation at room temperature followed by rapid thermal annealing is shown to be less effective in the case of Scandium compared with Gallium. Scandium implanted SiC exhibited a high resistivity in comparison to Gallium implanted crystals.
机译:Rutherford背散射,拉曼光谱以及光致发光,电阻率和霍尔测量已用于研究分别注入碳化硅中的Scan和镓离子的掺杂行为。与镓相比,在dium的情况下,在室温下注入然后进行快速热退火后恢复晶格的效率较低。与镓注入的晶体相比,implant注入的SiC表现出高电阻率。

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