Testing of third generation mobile phones will present a number of new challenges to design, production and service communities. There will be the need to understand testing of new modulation schemes that will present new challenges to the existing GSM community. The high degree of flexibility in the network configuration, handset features, and applications will require testing solutions that are both flexible and comprehensive so that the handset can be tested properly with the minimum of time and effort. This paper will discuss some of the problems, and possible solutions, for the testing of third generation handsets. This will consider the layer 1RF testing requirements, and the required layer 2&3 protocol capability to support this. We will present the test solutions that Anritsu has developed to enable the 3G community to overcome these testing requirements.
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