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A Knowledge Based System for Selecting a Test Methodology for a PLA

机译:基于知识的PLA选择测试方法的系统

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Testability is a very important aspect of VLSI circuits. Numerous design for testability (DFT) methods exist. Often designers face the complex problem of selecting the best DFT techniques for a particular chip under a set of design constraints and goals. In order to aid in designing testable circuits, a prototype knowledge based system has been developed which simulates a human expert on design of testable PLAs. The system, described in this paper, has knowledge about testable PLA design methodologies and is able to negotiate with the user so as to lead the user through the design space to find a satisfactory solution. A new search strategy, called reason analysis, is introduced.
机译:可测试性是VLSI电路的一个非常重要的方面。存在可测试性(DFT)方法的众多设计。设计人员经常面临在一系列设计约束和目标下为特定芯片选择最佳DFT技术的复杂问题。为了帮助设计可测试电路,已经开发了基于原型知识的系统,该系统模拟了可测试PLA设计方面的专家。本文描述的系统具有有关可测试的PLA设计方法的知识,并且能够与用户协商,从而引导用户在设计空间中找到满意的解决方案。引入了一种新的搜索策略,称为原因分析。

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