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首页> 外文会议>World Tribology Congress III vol.1; 20050912-16; Washington,DC(US) >ADHESIVE CONTACT MODELING OF ULTRA-LOW FLYING HEAD-DISK INTERFACES WITH AND WITHOUT ROUGHNESS EFFECTS
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ADHESIVE CONTACT MODELING OF ULTRA-LOW FLYING HEAD-DISK INTERFACES WITH AND WITHOUT ROUGHNESS EFFECTS

机译：具有和不具有粗糙度效果的超低空飞行头-磁盘界面的胶粘接触模型

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摘要

The head-disk interface (HDI) designed for sub-5nm pseudo-flying to obtain extremely high areal recording (EHDR) density of 1 Tbit/in~2 is susceptible to strong adhesive interfacial forces, and the accurate predictions of these interfacial forces are critical in ensuring successful implementation of ultra-low flying HDI's. In this paper, the effect of surface roughness on the adhesive forces at sub-5 nm flying-height regimes is investigated through a comparison to a simple two flat parallel surface counterpart. It was found that the effect of roughness promotes adhesion at higher separations than if a two flat parallel surface configuration is adopted. Prior to the onset of contact (during flying), however, the total adhesive force for an interface with low roughness is comparable to the two flat parallel surface approximation, thus significantly simplifying the analysis.
机译：设计用于5nm以下伪飞行以获得1 Tbit / in〜2的极高面记录（EHDR）密度的磁头-磁盘接口（HDI）易受强大的粘合界面力的影响，这些界面力的准确预测为对于确保超低飞行HDI的成功实施至关重要。在本文中，通过与简单的两个平坦平行表面对应物进行比较，研究了表面粗糙度对5 nm以下飞行高度状态下的粘合力的影响。已经发现，与采用两个平坦的平行表面构造相比，粗糙度的效果在更高的间距下促进了粘附。但是，在开始接触之前（在飞行过程中），具有低粗糙度的界面的总粘合力与两个平坦的平行表面近似值相当，从而大大简化了分析。

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