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Non-contacting six-port reflectometers for in-situ measurement of microwave circuit modules.

机译:非接触式六端口反射仪,用于微波电路模块的现场测量。

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摘要

Microwave circuits and devices, are commonly characterized using commercially available vector network analyzers (VNA). For an operating frequency up to about 110 GHz, a device under test (DUT) that is usually connected to the VNA through coaxial adapters which facilitate the transition from the DUT's transmission media to the VNA's coaxial cables. A test fixture is usually required for such a transition. Compared to the measurements using commercially available VNAs, In-Situ measurements allow the characterization of a DUT in the same environment where it is designed to operate, with no need of precision connectors or test fixtures. This approach is very attractive, particularly for those circuits operating at the upper portion of the microwave spectrum (100--300 GHz) and at the submillimeter-wave region (300--3000GHz), where planar transmission lines are frequently used and precision coaxial or waveguide adapters are largely unavailable.; A variety of non-contacting probing methods have been proposed and demonstrated for microwave circuit in-situ measurements. Most of them are focused on electromagnetic field-mapping. However, these techniques suffer from drawbacks. Some of them require quantification of the Pockels effect and require sophisticated laser instrumentation that is typically not found in standard microwave electronics laboratories. The others utilize coaxial probes which can present over-moding problems for high frequency operation and can be cumbersome to implement and align.; In this work, a new approach for non-contacting in-situ measurements of microwave circuits is investigated and its concept demonstrated. This new approach is a combination of a planar non-contacting probing structure and a six-port reflectometer architecture. The approach described in this work is a stand-alone instrument that has the potential to be monolithic integrated and hence may benefit from low-cost compared to other noncontacting in-situ measurement systems. In addition, a new calibration method based on null double injection technique is demonstrated and studied as an alternative six-port calibration method that does not require sliding terminations. This technique can be implemented and potentially automated using only a few widely-available microwave components, resulting in a more convenient and frequency-scalable system solution.
机译:通常使用市售的矢量网络分析仪(VNA)来表征微波电路和设备。对于高达110 GHz的工作频率,通常是通过同轴适配器将被测设备(DUT)连接到VNA,以促进从DUT的传输介质到VNA的同轴电缆的过渡。这种过渡通常需要测试夹具。与使用市售VNA进行的测量相比,原位测量可以在DUT设计运行的相同环境中表征DUT,而无需精密连接器或测试夹具。这种方法非常有吸引力,尤其是对于那些在微波频谱的上部(100--300 GHz)和亚毫米波区域(300--3000GHz)工作的电路,这些电路经常使用平面传输线并且需要精密同轴或波导适配器在很大程度上不可用。对于微波电路的原位测量,已经提出并证明了多种非接触探测方法。其中大多数集中在电磁场映射上。但是,这些技术具有缺点。其中一些需要对Pockels效应进行量化,并且需要复杂的激光仪器,而这在标准微波电子实验室中通常是找不到的。其他使用同轴探针,这些探针可能会在高频操作中出现过调制问题,并且难以实现和对准。在这项工作中,研究了一种微波电路非接触式原位测量的新方法,并演示了其概念。这种新方法是将平面非接触式探测结构与六端口反射仪结构结合在一起。本文中介绍的方法是一种独立的仪器,具有单片集成的潜力,因此与其他非接触式原位测量系统相比,可受益于低成本。此外,基于零双进样技术的一种新的校准方法得到了论证和研究,作为一种不需要滑动端接的替代六端口校准方法。仅使用少数几个广泛使用的微波组件就可以实施该技术,并且有可能实现自动化,从而获得更方便,可扩展频率的系统解决方案。

著录项

  • 作者

    Hui, Dan.;

  • 作者单位

    University of Virginia.;

  • 授予单位 University of Virginia.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2008
  • 页码 110 p.
  • 总页数 110
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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