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Measurement and application of near-field scan data: Prediction of currents, radiated emissions, and probe characteristics.

机译：近场扫描数据的测量和应用：电流，辐射发射和探头特性的预测。

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摘要

This dissertation examines the application of near field measurement techniques and analysis originally developed for the analysis of antennas to the specific case of electromagnetic compatibility.;The first section describes a procedure for estimating the current flowing in circuits and the chip lead frame from compensated near-field data. These techniques are applied to find currents on the pins of an integrated circuit, in traces buried beneath other traces in a PCB, and in traces over a slot in the ground plane. Methods of dealing with the ill-posed nature of the current-estimation problem are discussed, as are applications to electrically large structures.;The second section describes a procedure for using the equivalent current sources, derived from near field measurements, to represent the effects of EMI sources in enclosures and/or in proximity to other near field scattering objects. These methods will be applied to specific examples.;The third section describes and demonstrates a procedure, based on reciprocity, for characterizing (calibrating) near-field probes and compensating the near field probe measurements to reduce the near field distortion introduced by placing the probe in a previously unperturbed incident field. The effect of the near field probe in loading the source of the incident field will be neglected in all of the analysis in this section.;The last section of this work consists of an appendix summarizing the plane wave scattering theory and reciprocity theory previously developed by others and providing the underlying fundamental foundation for all of the proceeding sections.
机译：本文研究了近场测量技术和最初为分析天线而开发的分析方法在电磁兼容性特定情况下的应用。第一部分介绍了一种通过补偿后的近距离估算电路和芯片引线框架中电流的方法。现场数据。这些技术用于在集成电路的引脚上，埋在PCB中其他走线下方的走线中以及在接地平面中的槽上的走线中找到电流。讨论了解决电流估算问题不适定性的方法，以及在大型电气结构中的应用。第二部分介绍了使用从近场测量中得出的等效电流源来表示影响的过程外壳中和/或附近其他近场散射物体附近的EMI源。这些方法将应用于特定的示例。第三部分基于互易性，描述并演示了一种程序，用于表征（校准）近场探头并补偿近场探头的测量值，以减少放置探头时引入的近场失真在以前不受干扰的入射场中。在本节的所有分析中，都将忽略近场探针在加载入射场源中的作用。这项工作的最后一部分是一个附录，该附录总结了先前由波普尔提出的平面波散射理论和互易理论。其他内容，并为所有后续章节提供了基础基础。

著录项

  • 作者

    Weng, Haixiao.;

  • 作者单位

    University of Missouri - Rolla.;

  • 授予单位 University of Missouri - Rolla.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 123 p.
  • 总页数 123
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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