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Robust ultra-low power subthreshold digital circuit design.

机译:强大的超低功耗亚阈值数字电路设计。

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摘要

Operating CMOS circuits with power supplies below the threshold voltage has been suggested for ultra-low power systems. High fan-in/out circuits, such as those in memories, are prone to failure when operating in subthreshold since noise margins are diminished by reduced transistor on-to-off current ratios ION/IOFF. Design guidelines for robust subthreshold logic circuits are developed in this thesis. An analytical model has been derived to determine circuit fan-in/out limitations and the minimum supply voltage for operation. The model is applied to determine subthreshold circuit robustness as affected by fan-in/out and PVT variations.; A 512 x 13b ultra-low power subthreshold memory is fabricated on a 130-nm bulk CMOS process technology. The fabricated memory is fully functional for read operation with a 190 mV power supply at 28 kHz, and 216 mV for write operation. Single bits are measured to read and write properly with VDD as low as 103 mV and 129 mV, respectively. The memory operates at a 1 MHz clock rate with a 310 mV power supply. This operating point has 1.197 muW power consumption, of which 0.366 muW is due to leakage and 0.831 muW is due to dynamic power dissipation. A number of circuit techniques are presented to overcome the substantially reduced ION/IOFF and the poor drive strength of transistors operating in subthreshold, such as gated feedback memory cell, and hierarchical read and decoder circuits. A self-timed control of the keeper transistors is utilized to mitigate increased variability manifested in subthreshold operation.; The write margin and read stability of subthreshold memory cells corners have been analyzed and a more robust subthreshold memory cell was proposed. A semi-quantative model was used to analyze the subthreshold memory Vmin random distribution. Subthreshold memory has different circuit behaviors for write and read "1/0" operation, therefore, their Vmin in PDFs have different envelops. The determination of Vmin requires a guard band for high yield.; A two-stage pipeline microcontroller has been designed using time borrowing to overcome the significant sensitivity to variations in timing. Simulation results indicate that the proposed subthreshold microcontroller timing critical path is dominated by the program memory. Monte Carlo simulation shows wide timing variations and requiring VDD guardband.
机译:对于超低功耗系统,建议使用低于阈值电压的电源工作CMOS电路。高扇入/扇出电路(例如存储器中的扇出/扇出电路)在低于阈值的条件下操作时容易出现故障,因为噪声容限会因晶体管开/关电流比ION / IOFF的减小而减小。本文提出了鲁棒的亚阈值逻辑电路设计指南。已得出一个分析模型来确定电路扇入/流出限制和运行的最小电源电压。该模型用于确定受扇入/扇出和PVT变化影响的亚阈值电路的鲁棒性。 512 x 13b超低功耗亚阈值存储器是在130 nm体CMOS工艺技术上制造的。所制造的存储器在190 mV电源(28 kHz)和216 mV(写操作)的情况下具有读取功能的全部功能。在VDD分别低至103 mV和129 mV的情况下,测量单个位以正确读写。存储器在310 mV电源下以1 MHz时钟速率运行。该工作点的功耗为1.197μW,其中0.366μW是由于泄漏引起的,而0.831μW是由于动态功耗引起的。提出了许多电路技术来克服ION / IOFF的显着降低和亚阈值下工作的晶体管(如门控反馈存储单元以及分层读取和解码器电路)的不良驱动强度。利用保持器晶体管的自定时控制来减轻在亚阈值操作中表现出的增加的可变性。分析了亚阈值存储单元角落的写入容限和读取稳定性,并提出了更健壮的亚阈值存储单元。使用半定量模型分析亚阈值内存Vmin的随机分布。亚阈值存储器在写入和读取“ 1/0”操作中具有不同的电路行为,因此,它们在PDF中的Vmin具有不同的包络。 Vmin的确定需要一个保护带以获得高产率。利用时间借用设计了两级流水线微控制器,以克服对时序变化的显着敏感性。仿真结果表明,拟议的亚阈值微控制器定时关键路径由程序存储器控制。蒙特卡罗模拟显示出较大的时序变化,并需要VDD保护带。

著录项

  • 作者

    Chen, Jinhui.;

  • 作者单位

    Arizona State University.;

  • 授予单位 Arizona State University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 158 p.
  • 总页数 158
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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