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首页> 外文学位 >Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction.
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Quantitative texture analysis using time-of-flight neutron diffraction and electron back scatter diffraction.

机译：使用飞行时间中子衍射和电子背散射衍射进行定量纹理分析。

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摘要

The traditional quantitative texture analysis approach, which has relied on pole figure measurements with monochromatic X-ray or neutron diffraction, is not efficient for polymineralic rocks and low symmetry minerals, where there are often closely spaced and partially or completely overlapped diffraction peaks. A new approach, the Rietveld Texture Analysis or RTA, has recently been proposed. This method is based on the Rietveld and the polychromatic Time-of-Flight (TOF) neutron diffraction techniques, in which the texture information is evaluated, through iterations, from a large number of complete diffraction patterns, rather than a few separate peaks. This thesis work is the first application of the method to multiphase (e.g. eclogite), low-symmetry (e.g. plagioclase), and archaeological (e.g. ancient coins) materials. Its reliability in these complex materials is investigated.; Textures were measured by TOF neutron diffraction and analyzed with the RTA method. In addition, the SEM-EBSD technique was applied to the same samples of eclogite and plagioclase. Consistent results are obtained from both techniques. For the coins, the non-destructive requirement prevented them from additional SEM-EBSD analysis, yet the texture results were compared between two analytical computer programs MAUD (Material Analysis Using Diffraction) and GSAS (General Structure Analysis System). The results given by these two programs are in good agreement.; The study demonstrates that complex geological materials are amenable to this new quantitative texture analysis approach. This method is likely to add to a better understanding of deformation in complex geological materials. A combination of this method with the non-destructive TOF neutron diffraction measurement provides an appropriate tool for the characterization of archaeological objects.; As a secondary goal of the study, the advantages and limitations of the two modern experimental techniques, TOF neutron diffraction and SEM-EBSD, are explored and highlighted in the work. In particular, the ability of measuring bulk samples and the non-destructive nature of neutron diffraction, as well as the statistical relevance of individual orientation measurements of SEM-EBSD are emphasized.
机译：传统的定量纹理分析方法依靠单色X射线或中子衍射的极图测量，对于多矿物岩石和低对称性矿物（通常存在紧密间隔且部分或完全重叠的衍射峰）无效。最近提出了一种新方法，即Rietveld纹理分析或RTA。此方法基于Rietveld和多色飞行时间（TOF）中子衍射技术，其中通过迭代从大量完整的衍射图样（而不是几个单独的峰）中评估纹理信息。这项工作是该方法在多相（例如榴辉岩），低对称性（例如斜长石）和考古（例如古钱币）材料上的首次应用。研究了其在这些复杂材料中的可靠性。通过TOF中子衍射测量织构并通过RTA方法分析。此外，将SEM-EBSD技术应用于相同的榴辉岩和斜长石样品。从这两种技术获得一致的结果。对于硬币，非破坏性要求阻止了它们进行额外的SEM-EBSD分析，但是在两个分析计算机程序MAUD（使用衍射的材料分析）和GSAS（通用结构分析系统）之间比较了纹理结果。这两个程序给出的结果非常吻合。该研究表明，复杂的地质材料适合这种新的定量纹理分析方法。这种方法可能会更好地了解复杂地质材料中的变形。这种方法与非破坏性TOF中子衍射测量相结合，为表征考古物体提供了合适的工具。作为研究的次要目标，在工作中探索并强调了两种现代实验技术（TOF中子衍射和SEM-EBSD）的优点和局限性。尤其要强调的是，测量散装样品的能力和中子衍射的无损性质，以及SEM-EBSD各个方向测量值的统计相关性。

著录项

  • 作者

    Xie, Yanxia.;

  • 作者单位

    University of California, Berkeley.;

  • 授予单位 University of California, Berkeley.;
  • 学科 Geology.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 186 p.
  • 总页数 186
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 地质学;
  • 关键词

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