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Reduction of multiple reflections in infrared-imaging Fourier transform spectrometers.

机译：减少红外成像傅立叶变换光谱仪中的多次反射。

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摘要

The causes and effects of multiple reflections which occur in the beam splitter component of imaging Fourier Transform Spectrometers (FTSs) are investigated with the objective of determining methods to improve the quality of the data obtained from these instruments.; A complete literature review is included that addresses the history of interferometery, the theory of interferometry, beam splitters, field widening in FTSs, hyperspectral imaging, imaging spectrometers, image abnormalities, and mathematical modeling of interferometers.; The differences between imaging and non-imaging FTSs as well as their respective susceptibilities to multiple reflection problems are explored. Eight alternative beam splitter/compensator configurations for use in infrared imaging Fourier transform spectrometers are then presented. The objective is to identify one or more configurations that may reduce multiple reflection problems. The advantages and disadvantages of the eight configurations are compared and three characteristics are identified that are primary factors in reducing susceptibility to multiple reflections. These three characteristics are: (1) widened air gap, (2) small angles of incidence, and (3) antireflection coatings on aircalcium fluoride boundaries.; An improved beam splitter design is identified that combines the best qualities of the eight beam splitter configurations. The improved beam splitter design is then analyzed and compared to a “baseline” beam splitter design typical of current non-imaging FTSs. The comparison includes the results of a computer simulation of the baseline and improved designs.; The improved beam splitter shown to generate 77% fewer reflections overall and 69% fewer detector incident reflections than the baseline beam splitter. Also, the reflections that are incident on the detector in the improved beam splitter are shown to be at least a factor of ten lower in power than those in the baseline beam splitter.
机译：为了确定改善从这些仪器获得的数据质量的方法，研究了在成像傅立叶变换光谱仪（FTS）的分束器组件中发生多次反射的原因和影响。包括完整的文献综述，内容涉及干涉仪的历史，干涉仪的理论，分束器，FTS中的场拓宽，高光谱成像，成像光谱仪，图像异常以及干涉仪的数学建模。探讨了成像和非成像FTS之间的差异以及它们对多重反射问题的敏感性。然后介绍了用于红外成像傅立叶变换光谱仪的八种分束器/补偿器配置。目的是确定可以减少多重反射问题的一种或多种配置。比较了这八种配置的优缺点，并确定了三个特性，它们是减少多重反射敏感性的主要因素。这三个特征是：（1）气隙变宽;（2）小入射角;（3）空气氟化钙边界上的减反射膜;确定了一种改进的分束器设计，该设计结合了八种分束器配置的最佳质量。然后分析改进的分束器设计，并将其与当前非成像FTS典型的“基线”分束器设计进行比较。比较包括计算机模拟基线和改进设计的结果。改进的分束器显示出与基线分束器相比，总反射量减少了77％，检测器入射反射量减少了69％。同样，入射在改进的分束器中的检测器上的反射被显示为比基线分束器中的反射至少低十倍的功率。

著录项

  • 作者

    Redd, Justin David.;

  • 作者单位

    Utah State University.;

  • 授予单位 Utah State University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 1998
  • 页码 147 p.
  • 总页数 147
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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