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Preparation and characterization of thin films of buckminsterfullerite and the superconducting fullerides.

机译:巴克敏斯特富勒石和超导富勒德薄膜的制备和表征。

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摘要

We have designed and built a versatile thin film high/ultra-high vacuum (HV/UHV) deposition chamber, suitable for handling and evaporating highly reactive or poisonous materials. We have used this chamber to synthesize and characterize alkali-metal doped C;The evaporator is highly compartmentalized, and there are four main subchambers: (1) evaporation; (2) substrate heating; (3) cryostation; (4) sample transfer. The evaporation subchamber houses thermal evaporation sources, crystal rate monitors, and isolation shielding. The substrate heating subchamber contains a heating assembly for sample heating during deposition and in-situ annealing. The cryostation subchamber contains four sets of four-probe resistance monitoring stations for in-situ resistance versus temperature monitoring of our thin film samples to temperatures as low as 15 K. The transfer subchamber is used to extract samples from the substrate-holding block to permit in-situ study of our thin films using the two ultra-high vacuum (UHV) scanning probe microscopes (SPM) located within our laboratory.;Our substrates are heated to temperatures at around 150;Thin film samples have also been transferred in vacuum to a UHV scanning force microscope (SFM) and a UHV, low-temperature (LT), scanning tunneling microscope (STM). The SFM has provided information about the film surface morphology as well as its thickness. STM study has been used to examine the electronic surface properties of these doped Buckminsterfullerene films as well as to image the surface topography.
机译:我们设计并建造了通用的薄膜高/超高真空(HV / UHV)沉积室,适用于处理和蒸发高反应性或有毒物质。我们已经使用该腔室来合成和表征掺杂碱金属的C;蒸发器是高度分隔的,并且有四个主要子腔室:(1)蒸发; (2)基板加热; (3)冷冻站; (4)样品转移。蒸发子腔室装有热蒸发源,晶体速率监测器和隔离屏蔽。基板加热子腔室包含一个加热组件,用于在沉积和原位退火过程中加热样品。低温站子腔室包含四组四探针电阻监测站,用于在低至15 K的温度下对薄膜样品进行原位电阻与温度监测。转移子腔室用于从衬底固定块中提取样品,以允许使用位于我们实验室中的两个超高真空(UHV)扫描探针显微镜(SPM)对我们的薄膜进行原位研究;我们的基板被加热到约150的温度;薄膜样品也已在真空中转移到UHV扫描力显微镜(SFM)和UHV低温(LT)扫描隧道显微镜(STM)。 SFM提供了有关薄膜表面形态及其厚度的信息。 STM研究已用于检查这些掺杂的Buckminsterfullerene膜的电子表面性能以及对表面形貌成像。

著录项

  • 作者

    Ogawa, Ennis Takashi.;

  • 作者单位

    The University of Texas at Austin.;

  • 授予单位 The University of Texas at Austin.;
  • 学科 Physics Condensed Matter.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 1994
  • 页码 140 p.
  • 总页数 140
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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