首页> 外文学位 >Characterization of MBE Grown Metal, Semiconductor and Superconductor Films and Interfaces by Concurrent Use of In Situ Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Energy Loss Spectroscopy (REELS)

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Characterization of MBE Grown Metal, Semiconductor and Superconductor Films and Interfaces by Concurrent Use of In Situ Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Energy Loss Spectroscopy (REELS)

机译：通过同时使用原位反射高能电子衍射（RHEED）和反射电子能量损失谱（REELS）来表征MBE生长的金属，半导体和超导体薄膜和界面

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作者
Strawbridge, Brett William;
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作者单位

Arizona State University;

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授予单位 Arizona State University;
学科
学位 Ph.D.
年度 2012
页码 152 p.
总页数 152
原文格式 PDF
正文语种 eng
中图分类
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专利

1. Reflection high-energy electron loss spectroscopy (RHEELS): a new approach in the investigation of epitaxial thin film growth by reflection high-energy electron diffraction (RHEED) [J] . Masek K., Moroz V., Matolin V. Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology . 2003,第1a2期

机译：反射高能电子损耗光谱（RHEELS）：通过反射高能电子衍射（RHEED）研究外延薄膜生长的新方法
2. Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering [J] . M. Vos, M.R. Went Surface Science . 2007,第21期

机译：通过高能反射能量损失谱和电子卢瑟福背散射研究金属界面的形成
3. Characterization of Ion Beam Deposited ~(107)Ag Thin Films on Si(111) Surface by means of Rutherford Backscattering Spectroscopy and Reflection High Energy Electron Diffraction [J] . Takahiro ASAI, Masanori TAKEUCHI, Akihiro URANO, Journal of nuclear science and technology . 2006,第4期

机译：卢瑟福背散射光谱和反射高能电子衍射法表征Si（111）表面离子束沉积〜（107）Ag薄膜
4. An in situ study of MBE grown metallic multilayers by simultaneous measurements of optical reflectance and reflection high energy electron diffraction [C] . C.M.Emmerson, T-H.Shen, S.D.Evans, Magnetic ultra films, multilayers and surfaces of the E-MRS conference . 1997

机译：通过同时测量光学反射率和反射高能电子衍射通过同时测量MBE成长金属多层的原位研究
5. Characterization of the electronic and geometric structures of aluminas using X-ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, and low energy electron diffraction. [D] . Kao, Chi-Chang. 1988

机译：使用X射线光电子能谱，俄歇电子能谱，电子能量损失能谱和低能电子衍射来表征氧化铝的电子和几何结构。
6. In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy [O] . B Sanduijav, G Springholz 2010

机译：利用反射高能电子衍射和扫描隧道显微镜原位控制条形衬底上Si / Ge的生长
7. Characterization of Ion Beam Deposited 107Ag Thin Films on Si(111) Surface by means of Rutherford Backscattering Spectroscopy and Reflection High Energy Electron Diffraction [O] . Takahiro Asai, Masanori Takeuchi, Akihiro Urano, 2005

机译：利用卢瑟福背散射光谱和反射高能电子衍射表征离子束在si（111）表面沉积107ag薄膜
8. Characterization of Hydroquinone and Related Compounds Adsorbed at Pt(111) from Aqueous Solutions: Electron Energy-Loss Spectroscopy, Auger Spectroscopy, Low Energy Electron Diffraction, and Cyclic Voltammetry [R] . Lu, F., Salaita, G. N., Laguren-Davidson, L., 1988

机译：从水溶液中pt（111）吸附的对苯二酚和相关化合物的表征：电子能量损失光谱，俄歇光谱，低能电子衍射和循环伏安法

Characterization of MBE Grown Metal, Semiconductor and Superconductor Films and Interfaces by Concurrent Use of In Situ Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Energy Loss Spectroscopy (REELS)

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